[09-03] Suyoun Lee, Doo Seok Jeong, Jeung-hyun Jeong, Zhe Wu, Young-Wook Park, Hyung-Woo Ahn, Won Mok Kim and Byung-ki Cheong, "A study on the temperature dependence of characteristics of phase change memory devices," in Appli ... [BibTeX] [PDF]
[ABSTRACT] We investigated the temperature dependence of characteristics of phase change memory devices
composed of Ge2Sb2Te5 GST. We found that the RESET resistance RR, SET resistance RS, and
SET time tSET decreased with increasing ambient temperature Tamb. while RESET current IR
increased with T ...